| // SPDX-License-Identifier: GPL-2.0 | |
| /* | |
| * linux/drivers/mtd/onenand/onenand_bbt.c | |
| * | |
| * Bad Block Table support for the OneNAND driver | |
| * | |
| * Copyright(c) 2005 Samsung Electronics | |
| * Kyungmin Park <kyungmin.park@samsung.com> | |
| * | |
| * Derived from nand_bbt.c | |
| * | |
| * TODO: | |
| * Split BBT core and chip specific BBT. | |
| */ | |
| #include <linux/slab.h> | |
| #include <linux/mtd/mtd.h> | |
| #include <linux/mtd/onenand.h> | |
| #include <linux/export.h> | |
| /** | |
| * check_short_pattern - [GENERIC] check if a pattern is in the buffer | |
| * @param buf the buffer to search | |
| * @param len the length of buffer to search | |
| * @param paglen the pagelength | |
| * @param td search pattern descriptor | |
| * | |
| * Check for a pattern at the given place. Used to search bad block | |
| * tables and good / bad block identifiers. Same as check_pattern, but | |
| * no optional empty check and the pattern is expected to start | |
| * at offset 0. | |
| * | |
| */ | |
| static int check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td) | |
| { | |
| int i; | |
| uint8_t *p = buf; | |
| /* Compare the pattern */ | |
| for (i = 0; i < td->len; i++) { | |
| if (p[i] != td->pattern[i]) | |
| return -1; | |
| } | |
| return 0; | |
| } | |
| /** | |
| * create_bbt - [GENERIC] Create a bad block table by scanning the device | |
| * @param mtd MTD device structure | |
| * @param buf temporary buffer | |
| * @param bd descriptor for the good/bad block search pattern | |
| * @param chip create the table for a specific chip, -1 read all chips. | |
| * Applies only if NAND_BBT_PERCHIP option is set | |
| * | |
| * Create a bad block table by scanning the device | |
| * for the given good/bad block identify pattern | |
| */ | |
| static int create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip) | |
| { | |
| struct onenand_chip *this = mtd->priv; | |
| struct bbm_info *bbm = this->bbm; | |
| int i, j, numblocks, len, scanlen; | |
| int startblock; | |
| loff_t from; | |
| size_t readlen, ooblen; | |
| struct mtd_oob_ops ops; | |
| int rgn; | |
| printk(KERN_INFO "Scanning device for bad blocks\n"); | |
| len = 2; | |
| /* We need only read few bytes from the OOB area */ | |
| scanlen = ooblen = 0; | |
| readlen = bd->len; | |
| /* chip == -1 case only */ | |
| /* Note that numblocks is 2 * (real numblocks) here; | |
| * see i += 2 below as it makses shifting and masking less painful | |
| */ | |
| numblocks = this->chipsize >> (bbm->bbt_erase_shift - 1); | |
| startblock = 0; | |
| from = 0; | |
| ops.mode = MTD_OPS_PLACE_OOB; | |
| ops.ooblen = readlen; | |
| ops.oobbuf = buf; | |
| ops.len = ops.ooboffs = ops.retlen = ops.oobretlen = 0; | |
| for (i = startblock; i < numblocks; ) { | |
| int ret; | |
| for (j = 0; j < len; j++) { | |
| /* No need to read pages fully, | |
| * just read required OOB bytes */ | |
| ret = onenand_bbt_read_oob(mtd, | |
| from + j * this->writesize + bd->offs, &ops); | |
| /* If it is a initial bad block, just ignore it */ | |
| if (ret == ONENAND_BBT_READ_FATAL_ERROR) | |
| return -EIO; | |
| if (ret || check_short_pattern(&buf[j * scanlen], | |
| scanlen, this->writesize, bd)) { | |
| bbm->bbt[i >> 3] |= 0x03 << (i & 0x6); | |
| printk(KERN_INFO "OneNAND eraseblock %d is an " | |
| "initial bad block\n", i >> 1); | |
| mtd->ecc_stats.badblocks++; | |
| break; | |
| } | |
| } | |
| i += 2; | |
| if (FLEXONENAND(this)) { | |
| rgn = flexonenand_region(mtd, from); | |
| from += mtd->eraseregions[rgn].erasesize; | |
| } else | |
| from += (1 << bbm->bbt_erase_shift); | |
| } | |
| return 0; | |
| } | |
| /** | |
| * onenand_memory_bbt - [GENERIC] create a memory based bad block table | |
| * @param mtd MTD device structure | |
| * @param bd descriptor for the good/bad block search pattern | |
| * | |
| * The function creates a memory based bbt by scanning the device | |
| * for manufacturer / software marked good / bad blocks | |
| */ | |
| static inline int onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd) | |
| { | |
| struct onenand_chip *this = mtd->priv; | |
| return create_bbt(mtd, this->page_buf, bd, -1); | |
| } | |
| /** | |
| * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad | |
| * @param mtd MTD device structure | |
| * @param offs offset in the device | |
| * @param allowbbt allow access to bad block table region | |
| */ | |
| static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt) | |
| { | |
| struct onenand_chip *this = mtd->priv; | |
| struct bbm_info *bbm = this->bbm; | |
| int block; | |
| uint8_t res; | |
| /* Get block number * 2 */ | |
| block = (int) (onenand_block(this, offs) << 1); | |
| res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03; | |
| pr_debug("onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n", | |
| (unsigned int) offs, block >> 1, res); | |
| switch ((int) res) { | |
| case 0x00: return 0; | |
| case 0x01: return 1; | |
| case 0x02: return allowbbt ? 0 : 1; | |
| } | |
| return 1; | |
| } | |
| /** | |
| * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s) | |
| * @param mtd MTD device structure | |
| * @param bd descriptor for the good/bad block search pattern | |
| * | |
| * The function checks, if a bad block table(s) is/are already | |
| * available. If not it scans the device for manufacturer | |
| * marked good / bad blocks and writes the bad block table(s) to | |
| * the selected place. | |
| * | |
| * The bad block table memory is allocated here. It is freed | |
| * by the onenand_release function. | |
| * | |
| */ | |
| static int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd) | |
| { | |
| struct onenand_chip *this = mtd->priv; | |
| struct bbm_info *bbm = this->bbm; | |
| int len, ret = 0; | |
| len = this->chipsize >> (this->erase_shift + 2); | |
| /* Allocate memory (2bit per block) and clear the memory bad block table */ | |
| bbm->bbt = kzalloc(len, GFP_KERNEL); | |
| if (!bbm->bbt) | |
| return -ENOMEM; | |
| /* Set the bad block position */ | |
| bbm->badblockpos = ONENAND_BADBLOCK_POS; | |
| /* Set erase shift */ | |
| bbm->bbt_erase_shift = this->erase_shift; | |
| if (!bbm->isbad_bbt) | |
| bbm->isbad_bbt = onenand_isbad_bbt; | |
| /* Scan the device to build a memory based bad block table */ | |
| if ((ret = onenand_memory_bbt(mtd, bd))) { | |
| printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n"); | |
| kfree(bbm->bbt); | |
| bbm->bbt = NULL; | |
| } | |
| return ret; | |
| } | |
| /* | |
| * Define some generic bad / good block scan pattern which are used | |
| * while scanning a device for factory marked good / bad blocks. | |
| */ | |
| static uint8_t scan_ff_pattern[] = { 0xff, 0xff }; | |
| static struct nand_bbt_descr largepage_memorybased = { | |
| .options = 0, | |
| .offs = 0, | |
| .len = 2, | |
| .pattern = scan_ff_pattern, | |
| }; | |
| /** | |
| * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device | |
| * @param mtd MTD device structure | |
| * | |
| * This function selects the default bad block table | |
| * support for the device and calls the onenand_scan_bbt function | |
| */ | |
| int onenand_default_bbt(struct mtd_info *mtd) | |
| { | |
| struct onenand_chip *this = mtd->priv; | |
| struct bbm_info *bbm; | |
| this->bbm = kzalloc(sizeof(struct bbm_info), GFP_KERNEL); | |
| if (!this->bbm) | |
| return -ENOMEM; | |
| bbm = this->bbm; | |
| /* 1KB page has same configuration as 2KB page */ | |
| if (!bbm->badblock_pattern) | |
| bbm->badblock_pattern = &largepage_memorybased; | |
| return onenand_scan_bbt(mtd, bbm->badblock_pattern); | |
| } |